By W. Neumann, M. Pasemann, J. Heydenreich (auth.), Prof. Dr. H. C. Freyhardt (eds.)

ISBN-10: 3642687318

ISBN-13: 9783642687310

ISBN-10: 3642687334

ISBN-13: 9783642687334

In sturdy country physics and in fabrics technological know-how the research of the relationship among the homes of solids and their microstructure is of significant value. For crystalline fabrics this connection is said to the lattice constitution, and it may be proven convinc­ ingly that the cloth houses depend upon deviations from the proper lattice constitution within the majority of instances. accordingly a competent detection and research of defects in "nearly excellent" crystals is critical, and a adequate spatial answer of the equipment utilized is needed. simply because electrons at the one hand strongly engage with the problem to be investigated and however can simply be targeted electron-optical equipment are very valuable for this goal. they're utilized in the diffraction mode, within the imaging mode and within the spectroscopic mode. The possible excessive lateral answer within the imaging mode makes the appliance of electron microscopy specifically powerful. even if already worthy details on crystal defects should be received by utilizing the regimen means of diffraction distinction imagingl-3) which has a answer of a few four 10 nm - within the distinct weak-beam approach ) of a few nm -, the detection of crystal defects and inhomogeneities, resp. on an atomic or molecular point through assistance from excessive­ answer electron microscopy will get expanding importance.

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Microsc. Spectrosc. Electron. : Proc. 7th Europ. Congr. Electr. , The Hague 1980, Vol. I, p. 366 Krivanek, O. , Sheng, T. , Tsui, D. : Appl. Phys. Lett. 32, 437 (1978) Krivanek, O. , Mazur, J. : Appl. Phys. Lett. : Veroff. 10. Tag. Elektronenmikroskopie, Leipzig 1981, p. 374, A 138 HauBler, D. : Veroff. 9. Tag. Elektronenmikroskopie, Leipzig 1981, p. : Phys. : J. Appl. Cryst. : Acta Metall. : Mater. Sci. Engn. : Compt. Rend. -R. , Buseck, P. : Acta Cryst. A34, 709 (1978) Borisova, L. : Phys. : Met.

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I, p. 428 Krivanek, O. : Philos. Mag. 36, 931 (1977) Clarke, D. : J. Am. Ceram. Soc. : Proc. 7th Europ. Congr. Electr. , The Hague 1980, Vol. I, p. 384 Heuer, A. H. : J. Microsc. Spectrosc. Electron. : Proc. 7th Europ. Congr. Electr. , The Hague 1980, Vol. I, p. 366 Krivanek, O. , Sheng, T. , Tsui, D. : Appl. Phys. Lett. 32, 437 (1978) Krivanek, O. , Mazur, J. : Appl. Phys. Lett. : Veroff. 10. Tag. Elektronenmikroskopie, Leipzig 1981, p. 374, A 138 HauBler, D. : Veroff. 9. Tag. Elektronenmikroskopie, Leipzig 1981, p.

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Analytical Methods High-Melting Metals by W. Neumann, M. Pasemann, J. Heydenreich (auth.), Prof. Dr. H. C. Freyhardt (eds.)


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